【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Acceleratedmoistureresistance-Unbiasedautoclave
【原文标准名称】:半导体器件.机械和气候试验方法.加速耐湿性.无偏差压热器
【标准号】:BSEN60749-33-2004
【标准状态】:现行
【国别】:英国
【发布日期】:2004-06-22
【实施或试行日期】:2004-06-22
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:蒸压过程;环境试验;机械试验;集成电路;定义;试验;粘结强度;耐力;电子设备及元件;抗湿;电气工程;组件;半导体;半导体器件;试验条件;破坏试验;电学测量;高压釜;电子工程;气候试验
【英文主题词】:Autoclaveprocess;Autoclaves;Bondstrength;Climatictests;Components;Definition;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Environmentaltests;Integratedcircuits;Mechanicaltesting;Moistureresistance;Resistance;Semiconductordevices;Semiconductors;Testing;Testingconditions
【摘要】:Theunbiasedautoclavetestisperformedtoevaluatethemoistureresistanceintegrityofnon-hermeticpackagedsolid-statedevicesusingmoisturecondensingormoisturesaturatedsteamenvironments.Itisahighlyacceleratedtestwhichemploysconditionsofpressure,humidityandtemperatureundercondensingconditionstoacceleratemoisturepenetrationthroughtheexternalprotectivematerial(encapsulantorseal)oralongtheinterfacebetweentheexternalprotectivematerialandthemetallicconductorspassingthroughit.Thistestisusedtoidentifyfailuremechanismsinternaltothepackageandisdestructive.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:10P.;A4
【正文语种】:英语